Real-time microscopy reveals how semiconductor nanowires grow, and how bismuth seeds can speed their formation

Scientists from the National Graphene Institute at the University of Manchester and Sun Yat-sen University have captured the ...
Nanowerk

Nano-focusing: Why speed and precision matter in surface metrology and microscopy

Fast piezo and voice-coil nano-focusing systems keep microscopes and metrology tools sharply focused with nanometer precision ...
Phys.org

Leveling up scanning electron microscope measurements for chip manufacturing

Researchers from the National Institute of Standards and Technology (NIST) and KLA Corporation, a provider of inspection and measurement systems for the semiconductor and related industries, have ...
AZOM

CRAIC Technologies Introduces Updated 508PV™ Microscope Spectrophotometer for Semiconductor Metrology

CRAIC Technologies, the global leader in UV-Visible-NIR microspectroscopy, today announced significant technology updates to the 508PV ™ Microscope Spectrophotometer, designed to meet the precision ...
pv magazine International

Researchers capture first-ever images of electric charges across semiconductor materials within a solar cell

A team from the University of California Santa Barbara used ultrafast electron microscopy to record photocarriers as they diffuse across a silicon and germanium heterojunction. It is the first time ...
AZoNano

Semiconductor Failure Analysis Techniques

The first step for semiconductor chips is visual inspection using an optical microscope or electrical measurements. 2 Mechanical probing, electron beams, emission microscopy, liquid crystal, etc., are ...
Nanowerk

Nanopositioning solutions for SR-microscopy, material science, semiconductor test and metrology

(Nanowerk News) PI (Physik Instrumente), a global leader in nanopositioning motion control for life sciences, semiconductor, and photonics, offers a series of piezo-flexure controlled nanopositioning ...
AZoNano

witec360 Semiconductor Edition - Raman imaging microscope for large wafer inspection

The witec360 Semiconductor Edition is a high-end confocal Raman and photoluminescence (PL) microscope specifically configured for the chemical imaging of semiconducting materials. It helps researchers ...
Semiconductor Engineering

Review of Automatic EM Image Algorithms for Semiconductor Defect Inspection (KU Leuven, Imec)

A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...

Park Systems Secures KRW 100 Billion in Strategic Financing to Expand Production Capacity and Accelerate Global Growth

Park Systems Corp. (KOSDAQ: 140860), a global leader in atomic force microscopy (AFM) and nanometrology, today announced the successful completion of a KRW 100 billion (approximately USD 72 million) ...
AZOM

Reliable 6-Inch Wafer Inspection Using DIC Microscopy

This article describes a six-inch wafer inspection microscope that provides automated, reproducible differential interference contrast (DIC) imaging, regardless of the user’s skill level. Wafer ...